Nanosurf AG has introduced the FlexAFM, a versatile and flexible atomic force microscope that allows a wide range of applications to be performed. It can be used in both air and liquid environments, as well as in Materials and Life Science applications, in standard imaging or advanced measurement modes, and on a standard sample stage or an inverted microscope.
The product is compatible with many types of inverted microscopes and readily combines AFM and optical data (fluorescence/phase contrast/bright field).
Key features and benefits include flat and linear scanning due to the flexure-based scanner technology. Flexibility is also achieved with exchangeable cantilever holders that have been optimised for specialised tasks.
Measurement modes include Lateral Force Microscopy, Kelvin Probe Force Microscopy, Scanning Thermal Microscopy and Fluid Force Microscopy.