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National Instruments technical symposia build business

National Instruments’ (NI) 2009 NI Technical Symposiums are extremely successful, reaching 33 countries and 41 cities around the world, with the company’s Oceania stream of events adding to this success, NI said.

NI’s free annual professional development series’ Oceania group of events was hosted in the form on conferences in Auckland, Brisbane, Sydney and Melbourne and attracted over 500 registrations from engineers and scientists over the past few months, according to the company.

Delegates had the opportunity to attend technical presentations, learn about new products, participate in technology-focused discussions and attend exhibits featuring the latest solutions in design, control and test.

Topics on the agenda included:

• Extending the Graphical System Design Platform;

• Engineering Greener Products and Cleaner Technologies;

• Trends and Developments in Wireless Test;

• Simplifying FPGA Programming; and

• Ethernet-based Industrial Communication Protocols.

This year’s events featured guest presentations from companies and NI Alliance Partners including Solar Systems, the Australian Wool Testing Authority, Fisher and Paykel Appliances, the University of Queensland, CPE Systems, Nightside Test Design, MeT, Merit of Measurement, Riordon Cox and Hatch.

“It was great to see such a strong response to this year’s events in all locations” said NI Oceania regional director, Matej Krajnc.

“As we continue to extend the graphical system design platform and increase the power of LabVIEW, the diversity in applications and industries where our technologies are solving complex challenges continues to grow rapidly. This was very evident from the array of guest presentations and attendees at this year’s symposiums.

“Areas we are seeing NI solutions increasingly deployed range from solar and renewable energy, to advanced monitoring and medical device design, and we appreciate our guest speakers taking the time to showcase some of these applications at the events”.

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