National Instruments has opened registrations for its 2012 NI Technical Symposiums, a series of free professional development conferences for test, control and embedded design.
The events will be held in Adelaide (21 February), Brisbane (23 February), Auckland (29 February), Sydney (6 March) and Melbourne (8 March).
Proudly supported by PACE, Electronics News and ferret.com.au, each Symposium features six or more technical presentations, live demonstrations, interactive demo stations, exhibition areas, certification exams, guest presentations and the opportunity to learn more about new products and emerging technologies for embedded design, control and test.
Topics on the agenda for the 2012 events include:
- Software Development: Sessions dedicated to software development for measurement and control applications.
- Embedded Control and Monitoring: Gain an understanding of how to integrate measurements and control into an embedded device.
- Automated Test and Data Acquisition: New and advanced hardware and software tools including real-time and FPGA technology.
- RF & Wireless: Learn about next generation RF and wireless test technology.
Experts such as industry engineers and academics will discuss their applications and challenges they face.
“NI Technical Symposiums provide a unique opportunity to join a thriving community of fellow innovators, educators, engineers, scientists and NI Developers and explore the latest technologies to help increase productivity and improve efficiency,” said Matej Krajnc, Managing Director of National Instruments Australia, New Zealand and South Africa.
The 2012 NI Technical Symposiums will also feature an exhibition area and several guest presentations. It is expected to attract over 500 registrations in total across Australia and New Zealand. Admission is free, but limited space means early registration is recommended.
To register:
– Visit: NI TechSym
– Freecall: 1800 300 800 (AU) or 0800 553 322 (NZ)
– Email