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National Instruments meets global challenges: CEO

Global challenges were on the agenda at NIWeek 2009, with more than 3,000 engineers and scientists attending National Instruments’ (NI) annual graphical system design conference and exhibition earlier this month in Texas, US.

Executives from NI discussed how NI products are helping address global challenges during the 15th annual NIWeek exhibition, which attracted the largest number of NIWeek attendees to date, according to NI.

NI president, CEO and co-founder, Dr James Truchard, opened NIWeek 2009 by discussing how NI iscommitted to delivering real-world solutions to real-world problems through the continuous development of new products and technologies.

He highlighted how NI LabVIEW graphical system design software has helped engineers and scientists meet, exceed and exploit the complex engineering challenges associated with parallel architectures and multicore programming.

“We are meeting the challenges, we are innovating and we are making a difference with our technologies,” Truchard said.

“LabVIEW, PXI, CompactRIO and other NI products have proven to be very good tools for multicore and FPGA programming, and we will continue to help our customers create future innovations in these areas and others to address a variety of issues.”

NI vice president of marketing John Graff hosted NI engineers on stage to demonstrate new NI products including LabVIEW 2009, X Series multifunction data acquisition devices, NI VeriStand real-time testing software and the NI wireless sensor network.

LabVIEW 2009 aims to simplify the development challenges of parallel hardware architectures with new virtualisation technology that takes advantage of multicore systems as well as by offering new compiler improvements and IP that enhance field-programmable gate array (FPGA) design, says NI.

NI also claims its latest LabVIEW also makes it possible to deploy code to wireless sensor networks to help engineers and scientists build smarter industrial measurement and monitoring systems.

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