National Instruments has announced the NI PXIe-4135 source measurement unit (SMU) with a measurement sensitivity of 10fA and voltage output up to 200V. Engineers can use the SMU to measure low-current signals and take advantage of the high channel density, fast test throughput and flexibility of the product for applications such as wafer-level parametric tests, materials research and characterisation of low-current sensors and ICs.
Additionally, users can increase test throughput by taking advantage of a high-speed communication bus, deterministic hardware sequencing and digital control loop technology to custom-tune the SMU response for any device under testing. Users can also control the SMU response through software which removes unnecessarily long wait times for SMU settling, and offers the flexibility to help minimise overshoot and oscillations even with highly capacitive loads, according to the company.